International Journal of Application or Innovation in Engineering & Management
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ISSN 2319 – 4847
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Call for Paper, Published Articles, Indexing Infromation Differential MicroscopyImprovement Techniques Based on Position Sensitive Detectors, Authors : Teo Zeng, Chen Liu, Beng Wei, Kanai Ogale, Lim Zhang, International Journal of Application or Innovation in Engineering & Management (IJAIEM), www.ijaiem.org
Volume & Issue no: Volume 7, Issue 11, November 2018

Title:
Differential MicroscopyImprovement Techniques Based on Position Sensitive Detectors
Author Name:
Teo Zeng, Chen Liu, Beng Wei, Kanai Ogale, Lim Zhang
Abstract:
Abstract—Position Sensitive Detector (PSD) have applications in microscopy systems. In our previous research, the many error factors that are caused by the pincushion-type distortion of these sensors were investigated and addressed to significantly reduce signal to noise ratio in PSD and the microscopy system. To achieve further improvements for the microscopy system an algorithm based on localized differential method can be used. This novel approach is implemented in this research resulting in significant improvement in the precision of the microscopy system. Keywords— Differential Microscopy; Position Sensitive Detector; Localized differential method; Microscopy systems; PSD; Sensor calibration;
Cite this article:
Teo Zeng, Chen Liu, Beng Wei, Kanai Ogale, Lim Zhang , " Differential MicroscopyImprovement Techniques Based on Position Sensitive Detectors " , International Journal of Application or Innovation in Engineering & Management (IJAIEM), Volume 7, Issue 11, November 2018 , pp. 059-065 , ISSN 2319 - 4847.
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